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Title: Intrinsic Gilbert damping constant in epitaxial Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si Heusler alloys films

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4917334· OSTI ID:22410069
 [1]; ; ;  [2]
  1. Department of Electronic Engineering, Tohoku University, 6-6-05, Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579 (Japan)
  2. Department of Applied Physics, Tohoku University, 6-6-05, Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579 (Japan)

The (001)-oriented and (110)-oriented epitaxial grown Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si films were fabricated by magnetron sputtering technique in order to investigate the annealing temperature dependence of the intrinsic Gilbert damping constant (α). The stuck films, deposited on MgO and Al{sub 2}O{sub 3} a-plane substrates, respectively, were annealed at various temperatures ranging from 400 °C to 550 °C. The X-ray diffraction analysis was conducted to confirm that all the films were epitaxially grown. In addition, the ferromagnetic resonance measurements as well as the vibrating sample magnetometer were carried out to determine their magnetic properties. A small α of 0.004 was recorded for the sample with 001-oriented Co{sub 2}Fe{sub 0.4}Mn{sub 0.6}Si (CFMS (001)) and 110-oriented CFMS (CFMS (110)) annealed at 450 °C.

OSTI ID:
22410069
Journal Information:
Journal of Applied Physics, Vol. 117, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English