Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer

Journal Article · Thu May 07 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4917263· OSTI ID:22410067

Shimomura, Naoki; Nozaki, Tomohiro; Sahashi, Masashi ^[1]; Shibata, Tatsuo ^[2]

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1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)
2. Advanced Technology Development Center, TDK Corporation, Ichikawa 272-0026 (Japan)

The lattice parameter dependence of the Néel temperature T{sub N} of thin Cr{sub 2}O{sub 3} in a Cr{sub 2}O{sub 3}/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr{sub 2}O{sub 3} by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance T{sub N} in Cr{sub 2}O{sub 3}, which is consistent with theoretical calculations.

• OSTI ID: 22410067
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHROMIUM OXIDES
COBALT
COUPLING
CRYSTAL DEFECTS
INTERFACES
LATTICE PARAMETERS
LAYERS
MAGNETIZATION
NEEL TEMPERATURE
STRAINS
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION