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Title: Néel temperature of Cr{sub 2}O{sub 3} in Cr{sub 2}O{sub 3}/Co exchange-coupled system: Effect of buffer layer

The lattice parameter dependence of the Néel temperature T{sub N} of thin Cr{sub 2}O{sub 3} in a Cr{sub 2}O{sub 3}/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr{sub 2}O{sub 3} by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance T{sub N} in Cr{sub 2}O{sub 3}, which is consistent with theoretical calculations.
Authors:
; ; ;  [1] ;  [2]
  1. Department of Electronic Engineering, Tohoku University, Sendai 980-8579 (Japan)
  2. Advanced Technology Development Center, TDK Corporation, Ichikawa 272-0026 (Japan)
Publication Date:
OSTI Identifier:
22410067
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CHROMIUM OXIDES; COBALT; COUPLING; CRYSTAL DEFECTS; INTERFACES; LATTICE PARAMETERS; LAYERS; MAGNETIZATION; NEEL TEMPERATURE; STRAINS; TEMPERATURE DEPENDENCE; X-RAY DIFFRACTION