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Title: Magnetic properties of CuFe{sub 1−x}Cr{sub x}O{sub 2} nanoparticles surrounded by amorphous SiO{sub 2}

CuFe{sub 1−x}Cr{sub x}O{sub 2} (0 ≤ x ≤ 1.0) nanoparticles surrounded by amorphous SiO{sub 2} with an average diameter of 30–50 nm were synthesized using a wet chemical method. The annealing temperatures were controlled to yield various sizes of single-phase CuFe{sub 1−x}Cr{sub x}O{sub 2} nanoparticles. CuFeO{sub 2} bulk crystal is known to have a multiferroic delafossite structure with two Néel temperatures of 11 and 14 K; however, the transition temperature shifted higher as the Cr–ion doping level increased. In addition, the lattice constants decreased in accordance with increased Cr-ion doping, which was confirmed by X-ray diffraction measurements. The magnetization curves showed weak ferromagnetic behavior and no coercivity was observed. Hence, frustration in the triangular lattice of the delafossite structure can be released by Cr–ion doping and higher magnetization can be expected. A fine structure analysis through X-ray absorption fine structure measurements was also conducted. It was found that the structure of the Cu ion is similar to that of Cu{sub 2}O, and the c axis of the CuFe{sub 1−x}Cr{sub x}O{sub 2} should be shortened by the Cr–ion doping.
Authors:
; ; ;  [1]
  1. Department of Physics, Graduate School of Engineering, Yokohama National University, Yokohama 240-8501 (Japan)
Publication Date:
OSTI Identifier:
22410049
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; CHROMATES; CHROMIUM IONS; COERCIVE FORCE; COPPER IONS; COPPER OXIDES; CRYSTALS; FINE STRUCTURE; IRON COMPOUNDS; LATTICE PARAMETERS; MAGNETIC PROPERTIES; MAGNETIZATION; NANOPARTICLES; SILICON OXIDES; TRANSITION TEMPERATURE; X-RAY DIFFRACTION