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Title: Co thickness dependence of structural and magnetic properties in spin quantum cross devices utilizing stray magnetic fields

We investigate the Co thickness dependence of the structural and magnetic properties of Co thin-film electrodes sandwiched between borate glasses in spin quantum cross (SQC) devices that utilize stray magnetic fields. We also calculate the Co thickness dependence of the stray field between the two edges of Co thin-film electrodes in SQC devices using micromagnetic simulation. The surface roughness of Co thin films with a thickness of less than 20 nm on borate glasses is shown to be as small as 0.18 nm, at the same scanning scale as the Co film thickness, and the squareness of the hysteresis loop is shown to be as large as 0.96–1.0. As a result of the establishment of polishing techniques for Co thin-film electrodes sandwiched between borate glasses, we successfully demonstrate the formation of smooth Co edges and the generation of stray magnetic fields from Co edges. Theoretical calculation reveals that a strong stray field beyond 6 kOe is generated when the Co thickness is greater than 10 nm at a junction gap distance of 5 nm. From these experimental and calculation results, it can be concluded that SQC devices with a Co thickness of 10–20 nm can be expected to function as spin-filter devices.
Authors:
; ; ; ; ;  [1] ;  [2]
  1. Research Institute for Electronic Science, Hokkaido University, Sapporo, Hokkaido 001-0020 (Japan)
  2. Faculty of Engineering, Ibaraki University, Hitachi, Ibaraki 316-8511 (Japan)
Publication Date:
OSTI Identifier:
22410037
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BORATES; COBALT; ELECTRIC CONTACTS; ELECTRODES; GLASS; HYSTERESIS; MAGNETIC FIELDS; MAGNETIC PROPERTIES; ROUGHNESS; SEMICONDUCTOR JUNCTIONS; SPIN; SURFACES; THICKNESS; THIN FILMS