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Title: Automated crystal orientation and phase mapping in TEM

The paper describes an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope. The template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated. Some examples of applications are used to demonstrate the capability of the tool and potential developments are discussed.
Authors:
;
Publication Date:
OSTI Identifier:
22403598
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 98; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON DIFFRACTION; MAPPING; NANOSTRUCTURES; ORIENTATION; PHASE STABILITY; PHASE STUDIES; PRECESSION; TRANSMISSION ELECTRON MICROSCOPY