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Title: A method to correct coordinate distortion in EBSD maps

Drift during electron backscatter diffraction mapping leads to coordinate distortions in resulting orientation maps, which affects, in some cases significantly, the accuracy of analysis. A method, thin plate spline, is introduced and tested to correct such coordinate distortions in the maps after the electron backscatter diffraction measurements. The accuracy of the correction as well as theoretical and practical aspects of using the thin plate spline method is discussed in detail. By comparing with other correction methods, it is shown that the thin plate spline method is most efficient to correct different local distortions in the electron backscatter diffraction maps. - Highlights: • A new method is suggested to correct nonlinear spatial distortion in EBSD maps. • The method corrects EBSD maps more precisely than presently available methods. • Errors less than 1–2 pixels are typically obtained. • Direct quantitative analysis of dynamic data are available after this correction.
Authors:
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Publication Date:
OSTI Identifier:
22403569
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 96; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BACKSCATTERING; COMPARATIVE EVALUATIONS; CORRECTIONS; ELECTRON CHANNELING; ELECTRON DIFFRACTION; MAPPING; NONLINEAR PROBLEMS; ORIENTATION; PLATES; RECRYSTALLIZATION; TRANSMISSION ELECTRON MICROSCOPY