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Title: Nano-scale orientation mapping of graphite in cast irons

A diametrical section of a graphite spheroid from a ductile iron sample was prepared using the focused ion beam-lift out technique. Characterization of this section was carried out through automated crystal orientation mapping in a transmission electron microscope. This new technique automatically collects electron diffraction patterns and matches them with precalculated templates. The results of this investigation are crystal orientation and phase maps of the specimen, which bring new light to the understanding of growth mechanisms of this peculiar graphite morphology. This article shows that mapping the orientation of carbon-based materials such as graphite, which is difficult to achieve with conventional techniques, can be performed automatically and at high spatial resolution using automated crystal orientation mapping in a transmission electron microscope. - Highlights: • ACOM/TEM can be used to study the crystal orientation of carbon-based materials. • A spheroid is formed by conical sectors radiating from a central nuclei. • Misorientations exist within the conical sectors, defining various orientation domains.
Authors:
;  [1] ;  [2] ;  [1]
  1. Institut CARNOT CIRIMAT, Université de Toulouse, ENSIACET, CS 44362, 31030 Toulouse Cedex 4 (France)
  2. SIMAP, CNRS-Grenoble INP, BP 46 101 rue de la Physique, 38402 Saint Martin d'Hères (France)
Publication Date:
OSTI Identifier:
22403547
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 95; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CAST IRON; CRYSTAL GROWTH; CRYSTALS; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAPHITE; ION BEAMS; IRON; MAPPING; MORPHOLOGY; NANOSTRUCTURES; ORIENTATION; SEMICONDUCTOR JUNCTIONS; SPHEROIDS; TRANSMISSION ELECTRON MICROSCOPY