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Title: Mössbauer spectroscopy study of Al distribution in BaAl{sub x}Fe{sub 12−x}O{sub 19} thin films

Barium hexagonal ferrite (BaM) films grown on Si are a good candidate material for new-generations of on-wafer microwave devices operating at frequencies above 40 GHz. Doping BaM with Al increases the value of anisotropy field even more, and in combination with a large value of remanence, would allow one to create a self-biasing material/structure that would eliminate the need for permanent bias magnets in millimeter wave devices. To examine the occupation of Fe sublattices by Al ions, we carried out Conversion Electron Mössbauer Spectroscopy (CEMS) measurements at room temperature and zero magnetic field (after magnetizing the samples in a strong magnetic field). The spectra can be reasonably fitted with three components (sub-spectra) corresponding to different Fe sublattices. There are significant changes in the spectra with the addition of Al: The magnetic hyperfine field decreases for all three components, and their relative contributions also change remarkably. These observations are in agreement with the fact that the Al substitutes Fe, thus lowering the component contributions and the value of the hyperfine field. In addition, our previous XRD analysis indicates increasing grain misalignment with Al content, further supporting the CEMS data.
Authors:
;  [1] ;  [2] ; ;  [3]
  1. Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, 30-059 Kraków (Poland)
  2. (Poland)
  3. Department of Physics, University of Colorado, Colorado Springs, Colorado 80918 (United States)
Publication Date:
OSTI Identifier:
22403033
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ALUMINIUM; ALUMINIUM COMPOUNDS; ALUMINIUM IONS; ANISOTROPY; BARIUM COMPOUNDS; ELECTRONS; FERRITES; GHZ RANGE; MAGNETIC FIELDS; MAGNETS; MICROWAVE RADIATION; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION