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Title: Photo-crystallization in a-Se layer structures: Effects of film-substrate interface-rigidity

Amorphous selenium (a-Se) films deposited on rigid substrates can undergo photo-induced crystallization (PC) even at temperatures (T) well below the glass transition, T{sub g} ∼ 313 K. Substrate-generated shear strain is known to promote the PC process. In the present work, we explore the influence of different substrates (Si and glass), and different film-layer-substrate combinations, on the PC in a variety of a-Se films and film-structures. The intermediate layers (indium tin oxide and polyimide) are chosen to promote conductivity and/or to be a buffer against interface strain in structures of interest for digital imaging applications. The PC characteristics in these samples are evaluated and compared using optical microscopy, atomic-force microscopy, Raman mapping, and T-dependent Raman spectroscopy. Both the presence of a soft intermediate layer, and the thermal softening that occurs for T increasing through T{sub g}, inhibit the tendency for the onset of PC. The extensive PC mapping results in the wide range of samples studied here, as well as the suppression of PC near T{sub g} in this array of samples, strongly support the generality of this behavior. As a consequence, one may expect that the stability of a-Se films against PC can be enhanced by decreasing the rigidity of the film-substratemore » interface. In this regard, advanced film structures that employ flexible substrates, soft intermediate layers, and/or are designed to be operated near T{sub g} should be explored.« less
Authors:
; ;  [1] ;  [2] ; ;  [3] ; ;  [4] ;  [5]
  1. SUNY at Buffalo, Department of Physics, Buffalo, New York 14260-1500 (United States)
  2. SUNY at Buffalo, Department of Chemistry, Buffalo, New York 14260 (United States)
  3. Lakehead University, 955 Oliver Road, Thunder Bay, Ontario P7B 5E1 (Canada)
  4. University of Waterloo, Waterloo, Ontario N2L 3G1 (Canada)
  5. University of Saskatchewan, Saskatoon, Saskatchewan S7N 5A9 (Canada)
Publication Date:
OSTI Identifier:
22402660
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 19; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; FILMS; GLASS; INTERFACES; OPTICAL MICROSCOPY; RAMAN SPECTROSCOPY; SELENIUM; SHEAR; STRAINS; SUBSTRATES; TIN OXIDES