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Title: The microstructural evolution of ultrananocrystalline diamond films due to P ion implantation process—the annealing effect

The microstructural evolution of UNCD films which are P-ion implanted and annealed at 600 °C (or 800 °C) is systematically investigated. The difference of interaction that the UNCD content undergoes along the trajectory of the incident P-ions is reflected in the alteration of the granular structure. In regions where the P-ions reside, the “interacting zone,” which is found at about 300 nm beneath the surface of the films, coalescence of diamond grains occurs inducing nano-graphitic clusters. The annealing at 600 °C (or 800 °C) heals the defects and, in some cases, forms interconnected graphitic filaments that result in the decrease in surface resistance. However, the annealing at 600 °C (800 °C) induces marked UNCD-to-Si layers interaction. This interaction due to the annealing processes hinders the electron transport across the interface and degrades the electron field emission properties of the UNCD films. These microstructural evolution processes very well account for the phenomenon elaborating that, in spite of enhanced conductivity of the UNCD films along the film's surface due to the P-ion implantation and annealing processes, the electron field emission properties for these UNCD films do not improve.
Authors:
; ;  [1] ; ;  [2] ;  [3] ;  [4]
  1. Department of Engineering and System Science, National Tsing Hua University, Hsinchu 300, Taiwan (China)
  2. Department of Physics, Tamkang University, Tamsui 251, Taiwan (China)
  3. Scientific Research Division, National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China)
  4. Nuclear Science and Technology, Development Center Accelerator Division, National Tsing Hua University, Hsinchu 300, Taiwan (China)
Publication Date:
OSTI Identifier:
22402622
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 18; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ANNEALING; COALESCENCE; DIAMONDS; FIELD EMISSION; FILMS; GRAPHITE; INTERFACES; LAYERS; MICROSTRUCTURE; PHOSPHORUS IONS; SURFACES; ZONES