skip to main content

SciTech ConnectSciTech Connect

Title: Structural and optical properties of AgAlTe{sub 2} layers grown on sapphire substrates by closed space sublimation method

AgAlTe{sub 2} layers were grown on a- and c-plane sapphire substrates using a closed space sublimation method. Grown layers were confirmed to be single phase layers of AgAlTe{sub 2} by X-ray diffraction. AgAlTe{sub 2} layers were grown to have a strong preference for the (112) orientation on both kinds of substrates. The variation in the orientation of grown layers was analyzed in detail using the X-ray diffraction pole figure measurement, which revealed that the AgAlTe{sub 2} had a preferential epitaxial relationship with the c-plane sapphire substrate. The atomic arrangement between the (112) AgAlTe{sub 2} layer and sapphire substrates was compared. It was considered that the high order of the lattice arrangement symmetry probably effectively accommodated the lattice mismatch. The optical properties of the grown layer were also evaluated by transmittance measurements. The bandgap energy was found to be around 2.3‚ÄČeV, which was in agreement with the theoretical bandgap energy of AgAlTe{sub 2}.
Authors:
;  [1] ;  [1] ;  [2]
  1. Department of Electrical Engineering and Bioscience, Waseda University, 3-4-1 Ohkubo, Shinjuku, Tokyo 169-8555 (Japan)
  2. (Japan)
Publication Date:
OSTI Identifier:
22402616
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 18; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; COMPARATIVE EVALUATIONS; CRYSTAL DEFECTS; EPITAXY; EV RANGE; LAYERS; OPTICAL PROPERTIES; ORIENTATION; SAPPHIRE; SUBLIMATION; SUBSTRATES; SYMMETRY; VARIATIONS; X-RAY DIFFRACTION