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Title: Self-modulated nanostructures in super-large-period Bi{sub 11}(Fe{sub 5}CoTi{sub 3}){sub 10/9}O{sub 33} epitaxial thin films

Super-large-period Aurivillius thin films with a pseudo-period of ten were grown on (0 0 1) SrTiO{sub 3} substrates using the pulsed laser deposition method. The as-grown films are found to be coherently strained to the substrate and atomically smooth. X-ray diffraction indicates an average periodicity of ten, while analysis with the high resolution scanning transmission electron microscopy reveals a self-modulated nanostructure in which the periodicity changes as the film thickness increases. Finally, we discuss the magnetic and possible ferroelectric properties of the self-modulated large period Aurivillius films at the room temperature.
Authors:
; ; ;  [1] ;  [2] ;  [1] ;  [2] ;  [2] ;  [1] ; ;  [1] ;  [2] ;  [2] ; ;  [3] ;  [4] ;
  1. Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026 (China)
  2. (China)
  3. College of Physics Science and Technology, Yangzhou University, Yangzhou 225002 (China)
  4. Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio 45433 (United States)
Publication Date:
OSTI Identifier:
22402497
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 21; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BISMUTH COMPLEXES; BISMUTH COMPOUNDS; COBALT COMPOUNDS; ENERGY BEAM DEPOSITION; EPITAXY; FERROELECTRIC MATERIALS; IRON COMPOUNDS; LASER RADIATION; NANOSTRUCTURES; PERIODICITY; PULSED IRRADIATION; STRAINS; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION