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Title: Optical modeling and electrical properties of cadmium oxide nanofilms: Developing a meta–heuristic calculation process model

Cadmium oxide thin films were deposited onto glass substrates by sol–gel dip-coating method and annealed in air. The normal incidence transmittance of the films was measured by a spectrophotometer. D.C electrical parameters such as carrier concentration and mobility were analyzed by Hall Effect measurements. A combination of Forouhi–Bloomer and standard Drude model was used to simulate the optical constants and thicknesses of the films from transmittance data. The transmittance spectra of the films in the visible domain of wavelengths were successfully fitted by using the result of a hybrid particle swarm optimization method and genetic algorithm. The simulated transmittance is in good accordance with the measured spectrum in the whole measurement wavelength range. The electrical parameters obtained from the optical simulation are well consistent with those measured electrically by Hall Effect measurements.
Authors:
 [1] ;  [2] ;  [3] ;  [4]
  1. Nano Research Lab, Lahijan Branch, Islamic Azad University, P.O. Box 1616, Lahijan (Iran, Islamic Republic of)
  2. Department of Applied Mathematics, Lahijan Branch, Islamic Azad University, Lahijan (Iran, Islamic Republic of)
  3. Department of Civil Engineering, Faculty of Technology, University of Guilan, Rasht (Iran, Islamic Republic of)
  4. Department of Mechanical Engineering, Faculty of Technology, University of Guilan, Rasht (Iran, Islamic Republic of)
Publication Date:
OSTI Identifier:
22399405
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 13; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION SPECTRA; ALGORITHMS; ANNEALING; CADMIUM OXIDES; CARRIER MOBILITY; COMPUTERIZED SIMULATION; CONCENTRATION RATIO; DIP COATING; ELECTRICAL PROPERTIES; HALL EFFECT; SOL-GEL PROCESS; SPECTROPHOTOMETRY; SUBSTRATES; THIN FILMS