Temperature dependence of the electronic transitions in BiFeO{sub 3} thin film studied by spectroscopic ellipsometry

Journal Article · Tue Apr 07 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4916722· OSTI ID:22399389

Kang, T. D.; Jeon, B. C. ^[1]

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1. Center for Correlated Electron Systems, Institute for Basic Science, Seoul 151-742 (Korea, Republic of)

The temperature dependence of the electronic response of BiFeO{sub 3} thin film grown on a SrTiO{sub 3} substrate is investigated using spectroscopic ellipsometry. By analyzing the pseudodielectric function, we identify two d-d crystal field transitions of Fe{sup 3+} ions in the energy region between 1 and 2 eV. The d-d transitions show abnormal temperature dependence that cannot be attributed to conventional electron-phonon interactions. The origin of the abnormal temperature dependence is discussed in terms of spin-charge coupling. The temperature dependence of the charge transfer transitions located above 2.5 eV is characterized by standard critical point model analysis of the 2nd derivatives of the dielectric function. This analysis provides detailed information of the critical point parameters for charge transfer transitions.

• OSTI ID: 22399389
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 13; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BISMUTH COMPOUNDS
CRYSTAL FIELD
DIELECTRIC MATERIALS
ELECTRON-PHONON COUPLING
ELLIPSOMETRY
EV RANGE
IRON IONS
IRON OXIDES
PERMITTIVITY
SPIN
STRONTIUM TITANATES
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS