Annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films

Journal Article · Sat Mar 28 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4915330· OSTI ID:22399340

Alves, M. J. P.; Gonzalez-Chavez, D. E.; Sommer, R. L. ^[1]; Bohn, F. ^[2]

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1. Centro Brasileiro de Pesquisas Físicas, Rua Dr. Xavier Sigaud 150, Urca, 22290-180 Rio de Janeiro, RJ (Brazil)
2. Departamento de Física Teórica e Experimental, Universidade Federal do Rio Grande do Norte, 59078-900 Natal, RN (Brazil)

We systematically investigate the annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films with thickness of 100 nm. We correlate the non-uniform residual stress obtained from grazing incidence x-ray diffraction measurements with the ferromagnetic resonance (FMR) linewidth due to effective field inhomogeneities measured from broadband ferromagnetic resonance absorption measurements. We also estimate the annealing temperature effect on the Gilbert and two-magnon scattering contributions to the total ferromagnetic resonance FMR linewidth. We show that the effective field inhomogeneities constitute the main contribution to the microwave linewidth, while this contribution is related to the non-uniform residual stress in the films which is reduced by thermal annealing.

• OSTI ID: 22399340
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ANNEALING
COPPER COMPOUNDS
FERROMAGNETIC MATERIALS
FERROMAGNETIC RESONANCE
FERROMAGNETISM
IRON COMPOUNDS
LINE BROADENING
LINE WIDTHS
MICROWAVE RADIATION
NIOBIUM COMPOUNDS
RESIDUAL STRESSES
SILICON BORIDES
THIN FILMS
X-RAY DIFFRACTION