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Title: Annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films

We systematically investigate the annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films with thickness of 100 nm. We correlate the non-uniform residual stress obtained from grazing incidence x-ray diffraction measurements with the ferromagnetic resonance (FMR) linewidth due to effective field inhomogeneities measured from broadband ferromagnetic resonance absorption measurements. We also estimate the annealing temperature effect on the Gilbert and two-magnon scattering contributions to the total ferromagnetic resonance FMR linewidth. We show that the effective field inhomogeneities constitute the main contribution to the microwave linewidth, while this contribution is related to the non-uniform residual stress in the films which is reduced by thermal annealing.
Authors:
; ;  [1] ;  [2]
  1. Centro Brasileiro de Pesquisas Físicas, Rua Dr. Xavier Sigaud 150, Urca, 22290-180 Rio de Janeiro, RJ (Brazil)
  2. Departamento de Física Teórica e Experimental, Universidade Federal do Rio Grande do Norte, 59078-900 Natal, RN (Brazil)
Publication Date:
OSTI Identifier:
22399340
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; ANNEALING; COPPER COMPOUNDS; FERROMAGNETIC MATERIALS; FERROMAGNETIC RESONANCE; FERROMAGNETISM; IRON COMPOUNDS; LINE BROADENING; LINE WIDTHS; MICROWAVE RADIATION; NIOBIUM COMPOUNDS; RESIDUAL STRESSES; SILICON BORIDES; THIN FILMS; X-RAY DIFFRACTION