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Title: Effect of Ar{sup +} ion irradiation on the microstructure of pyrolytic carbon

Pyrolytic carbon (PyC) coatings prepared by chemical vapor deposition were irradiated by 300‚ÄČkeV Ar{sup +} ions. Then, atomic force microscopy, synchrotron-based grazing incidence X-ray diffraction, Raman spectroscopy, X-ray photoemission spectroscopy, and transmission electron microscopy were employed to study how Ar{sup +} irradiation affects the microstructure of PyC, including the microstructural damage mechanisms and physics driving these phenomena. The 300‚ÄČkeV Ar{sup +} ion irradiation deteriorated the structure along the c-axis, which increased the interlayer spacing between graphene layers. With increasing irradiation dose, the density of defect states on the surface of PyC coating increases, and the basal planes gradually loses their initial ordering resulting in breaks in the lattice and turbulence at the peak damage dose reaches 1.58 displacement per atom (dpa). Surprisingly, the PyC becomes more textured as it becomes richer in structural defects with increasing irradiation dose.
Authors:
; ; ; ; ; ;  [1] ;  [2] ; ;  [3] ;  [4]
  1. Key Laboratory of Nuclear Radiation and Nuclear Energy Technology, Chinese Academy of Sciences, Shanghai 201800 (China)
  2. (China)
  3. Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800 (China)
  4. Shenyang National Laboratory for Materials Science, Institute of Metal Research Chinese Academy of Sciences, Shenyang 110016 (China)
Publication Date:
OSTI Identifier:
22399317
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 11; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ARGON IONS; ATOMIC DISPLACEMENTS; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; COATINGS; GRAPHENE; IRRADIATION; KEV RANGE; LAYERS; MICROSTRUCTURE; PHOTOELECTRON SPECTROSCOPY; PYROLYTIC CARBON; RADIATION DOSES; RAMAN SPECTROSCOPY; TEXTURE; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY DIFFRACTION