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Title: Structural and magnetic properties of epitaxial delafossite CuFeO{sub 2} thin films grown by pulsed laser deposition

Growth of pure phase delafossite CuFeO{sub 2} thin films on Al{sub 2}O{sub 3} (00.1) substrates by pulsed laser deposition was systematically investigated as a function of growth temperature and oxygen pressure. X-ray diffraction, transmission electron microscopy, Raman scattering, and x-ray absorption spectroscopy confirmed the existence of the delafossite phase. Infrared reflectivity spectra determined a band edge at 1.15 eV, in agreement with the bulk delafossite data. Magnetization measurements on CuFeO{sub 2} films demonstrated a phase transition at T{sub C} ≈ 15 ± 1 K, which agrees with the first antiferromagnetic transition at 14 K in the bulk CuFeO{sub 2}. Low temperature magnetic phase is best described by commensurate, weak ferromagnetic spin ordering along the c-axis.
Authors:
; ; ; ; ; ; ;  [1] ; ;  [2] ; ;  [3]
  1. Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506-6315 (United States)
  2. Department of Mechanical and Aerospace Engineering, West Virginia University, Morgantown, West Virginia 26506-6070 (United States)
  3. Pontificia Universidad Catolica, Instituto de Física, Santiago (Chile)
Publication Date:
OSTI Identifier:
22399203
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 1; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION SPECTROSCOPY; ALUMINIUM OXIDES; ANTIFERROMAGNETISM; COPPER COMPOUNDS; CRYSTAL GROWTH; ENERGY BEAM DEPOSITION; EPITAXY; INFRARED SPECTRA; IRON OXIDES; LASER RADIATION; MAGNETIC PROPERTIES; MAGNETIZATION; PHASE TRANSFORMATIONS; PULSED IRRADIATION; RAMAN EFFECT; TEMPERATURE DEPENDENCE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY