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Title: High-resolution dichroic imaging of magnetic flux distributions in superconductors with scanning x-ray microscopy

The penetration of magnetic flux into high-temperature superconductors has been observed using a high-resolution technique based on x-ray magnetic circular dichroism. Superconductors coated with thin soft-magnetic layers are observed in a scanning x-ray microscope under the influence of external magnetic fields. Resulting electric currents in the superconductor create an inhomogeneous magnetic field distribution above the superconductor and lead to a local reorientation of the ferromagnetic layer. Measuring the local magnetization of the ferromagnet by x-ray absorption microscopy with circular-polarized radiation allows the analysis of the magnetic flux distribution in the superconductor with a spatial resolution on the nanoscale.
Authors:
; ; ;  [1] ;  [2]
  1. MPI for Intelligent Systems, Heisenbergstr. 3, D-70569 Stuttgart (Germany)
  2. Research Institute for Innovative Surfaces, FINO, Aalen University, Beethovenstr. 1, D-73430 Aalen (Germany)
Publication Date:
OSTI Identifier:
22399117
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 2; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; ELECTRIC CURRENTS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; HIGH-TC SUPERCONDUCTORS; LAYERS; MAGNETIC CIRCULAR DICHROISM; MAGNETIC FIELDS; MAGNETIC FLUX; MAGNETIZATION; MICROSCOPY; NANOSTRUCTURES; SPATIAL RESOLUTION; X RADIATION