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Title: Multi-mode technique for the determination of the biaxial Y{sub 2}SiO{sub 5} permittivity tensor from 300 to 6 K

The Y{sub 2}SiO{sub 5} (YSO) crystal is a dielectric material with biaxial anisotropy with known values of refractive index at optical frequencies. It is a well-known rare-earth (RE) host material for optical research and more recently has shown promising performance for quantum-engineered devices. In this paper, we report the first microwave characterization of the real permittivity tensor of a bulk YSO sample, as well as an investigation of the temperature dependence of the tensor components from 296 K down to 6 K. Estimated uncertainties were below 0.26%, limited by the precision of machining the cylindrical dielectric. Also, the electrical Q-factors of a few electromagnetic modes were recorded as a way to provide some information about the crystal losses over the temperature range. To solve the tensor components necessary for a biaxial crystal, we developed the multi-mode technique, which uses simultaneous measurement of low order whispering gallery modes. Knowledge of the permittivity tensor offers important data, essential for the design of technologies involving YSO, such as microwave coupling to electron and hyperfine transitions in RE doped samples at low temperatures.
Authors:
; ;  [1] ;  [2] ;  [3]
  1. School of Physics, The University of Western Australia, Crawley 6009 (Australia)
  2. (EQuS), 35 Stirling Hwy, Crawley 6009 (Australia)
  3. Instytut Mikroelektroniki i Optoelektroniki PW, Koszykowa 75, 00-662 Warsaw (Poland)
Publication Date:
OSTI Identifier:
22399050
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 19; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANISOTROPY; COUPLING; CRYSTALS; DIELECTRIC MATERIALS; DOPED MATERIALS; ELECTRONS; MICROWAVE RADIATION; PERMITTIVITY; REFRACTIVE INDEX; TEMPERATURE DEPENDENCE; TENSORS; YTTRIUM SILICATES