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Title: Electric field and temperature dependence of dielectric permittivity in strontium titanate investigated by a photoemission study on Pt/SrTiO{sub 3}:Nb junctions

Schottky junctions made from platinum and niobium-doped strontium titanate (SrTiO{sub 3}:Nb) were investigated by hard X-ray photoemission (HXPES) and through a band bending behavior simulation using a phenomenological model, which assumes a decrease in dielectric constant due to an electric field. Thus, we confirmed that the observed HXPES spectra at relatively high temperatures, e.g., >250 K, were well simulated using this phenomenological model. In contrast, it was inferred that the model was not appropriate for junction behavior at lower temperatures, e.g., <150 K. Therefore, a reconstruction of the phenomenological model is necessary to adequately explain the dielectric properties of SrTiO{sub 3}.
Authors:
 [1] ;  [2] ; ; ; ; ;  [1] ;  [3] ;  [4] ;  [1] ;  [5]
  1. National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044 (Japan)
  2. (Japan)
  3. Synchrotron X-ray Station at SPring-8, NIMS, 1-1-1 Kouto, Sayo, Hyogo 679-5148 (Japan)
  4. Murata Manufacturing Co., Ltd., 10–1, Higashikotari 1–chome, Nagaokakyo–shi, Kyoto 617–8555 (Japan)
  5. (MCES), Mailbox S2-12, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-0026 (Japan)
Publication Date:
OSTI Identifier:
22399035
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 19; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DIELECTRIC MATERIALS; DOPED MATERIALS; ELECTRIC CONTACTS; ELECTRIC FIELDS; EMISSION SPECTRA; HARD X RADIATION; NIOBIUM; PERMITTIVITY; PHOTOEMISSION; PLATINUM; SEMICONDUCTOR JUNCTIONS; STRONTIUM TITANATES; TEMPERATURE DEPENDENCE