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Title: Probing magnetic and electric optical responses of silicon nanoparticles

We study experimentally both magnetic and electric optically induced resonances of silicon nanoparticles by combining polarization-resolved dark-field spectroscopy and near-field scanning optical microscopy measurements. We reveal that the scattering spectra exhibit strong sensitivity of electric dipole response to the probing beam polarization and attribute the characteristic asymmetry of measured near-field patterns to the excitation of a magnetic dipole mode. The proposed experimental approach can serve as a powerful tool for the study of photonic nanostructures possessing both electric and magnetic optical responses.
Authors:
; ; ; ;  [1] ;  [1] ;  [2] ;  [3] ;  [4] ; ;  [3] ; ;  [5] ;  [1] ;  [6]
  1. ITMO University, St. Petersburg 197101 (Russian Federation)
  2. (Israel)
  3. Data Storage Institute, A*STAR (Agency for Science Technology and Research), Singapore 117608 (Singapore)
  4. (Singapore)
  5. Nonlinear Physics Centre, Research School of Physics and Engineering, Australian National University, Canberra ACT 2601 (Australia)
  6. (Australia)
Publication Date:
OSTI Identifier:
22398951
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ASYMMETRY; ELECTRIC DIPOLES; ENERGY SPECTRA; EXCITATION; MAGNETIC DIPOLES; NANOPARTICLES; NANOSTRUCTURES; POLARIZATION; PROBES; SCANNING LIGHT MICROSCOPY; SCATTERING; SENSITIVITY; SILICON