Probing magnetic and electric optical responses of silicon nanoparticles

Journal Article · Mon Apr 27 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4919536· OSTI ID:22398951

Permyakov, Dmitry; Sinev, Ivan; Markovich, Dmitry; Samusev, Anton; Belov, Pavel ^[1]; Ginzburg, Pavel ^[1]; Valuckas, Vytautas ^[2]; Kuznetsov, Arseniy I.; Luk'yanchuk, Boris S. ^[2]; Miroshnichenko, Andrey E.; Neshev, Dragomir N. ^[3]; Kivshar, Yuri S. ^[1]

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1. ITMO University, St. Petersburg 197101 (Russian Federation)
2. Data Storage Institute, A*STAR (Agency for Science Technology and Research), Singapore 117608 (Singapore)
3. Nonlinear Physics Centre, Research School of Physics and Engineering, Australian National University, Canberra ACT 2601 (Australia)

We study experimentally both magnetic and electric optically induced resonances of silicon nanoparticles by combining polarization-resolved dark-field spectroscopy and near-field scanning optical microscopy measurements. We reveal that the scattering spectra exhibit strong sensitivity of electric dipole response to the probing beam polarization and attribute the characteristic asymmetry of measured near-field patterns to the excitation of a magnetic dipole mode. The proposed experimental approach can serve as a powerful tool for the study of photonic nanostructures possessing both electric and magnetic optical responses.

• OSTI ID: 22398951
• Journal Information: Applied Physics Letters, Vol. 106, Issue 17; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
ASYMMETRY
ELECTRIC DIPOLES
ENERGY SPECTRA
EXCITATION
MAGNETIC DIPOLES
NANOPARTICLES
NANOSTRUCTURES
POLARIZATION
PROBES
SCANNING LIGHT MICROSCOPY
SCATTERING
SENSITIVITY
SILICON