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Title: A simple and wide-range refractive index measuring approach by using a sub-micron grating

This paper presents the design and simulation results of a high-precision low-cost refractometer that demonstrates the main advantage of a wide measurement range (1 ≤ n ≤ 2). The proposed design is based on the diffractive properties of sub-micron gratings and Snell's Law. The precision and uncertainty factors of the proposed system were tested and analyzed, revealing that the proposed refractometer demonstrates a wide measurement range with sensitivity of 10{sup −4}.
Authors:
; ;  [1]
  1. Department of Power Mechanical Engineering, National Tsing Hua University, 101 Section 2, Kuang-Fu Road, Hsinchu 30013, Taiwan (China)
Publication Date:
OSTI Identifier:
22398894
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ACCURACY; COMPUTERIZED SIMULATION; DESIGN; DIFFRACTION; DIFFRACTION GRATINGS; REFRACTIVE INDEX; SENSITIVITY