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Title: High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging

We demonstrate a high-throughput charged particle analysis platform, which is based on lensfree on-chip microscopy for rapid ion track analysis using allyl diglycol carbonate, i.e., CR-39 plastic polymer as the sensing medium. By adopting a wide-area opto-electronic image sensor together with a source-shifting based pixel super-resolution technique, a large CR-39 sample volume (i.e., 4 cm × 4 cm × 0.1 cm) can be imaged in less than 1 min using a compact lensfree on-chip microscope, which detects partially coherent in-line holograms of the ion tracks recorded within the CR-39 detector. After the image capture, using highly parallelized reconstruction and ion track analysis algorithms running on graphics processing units, we reconstruct and analyze the entire volume of a CR-39 detector within ∼1.5 min. This significant reduction in the entire imaging and ion track analysis time not only increases our throughput but also allows us to perform time-resolved analysis of the etching process to monitor and optimize the growth of ion tracks during etching. This computational lensfree imaging platform can provide a much higher throughput and more cost-effective alternative to traditional lens-based scanning optical microscopes for ion track analysis using CR-39 and other passive high energy particle detectors.
Authors:
; ; ; ; ; ; ; ;  [1] ;  [1] ;  [2] ;  [3]
  1. Electrical Engineering Department, University of California, Los Angeles, California 90095 (United States)
  2. (United States)
  3. (CNSI), University of California, Los Angeles, California 90095 (United States)
Publication Date:
OSTI Identifier:
22398888
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALGORITHMS; CAPTURE; CARBONATES; DIELECTRIC TRACK DETECTORS; ETCHING; HOLOGRAPHY; IMAGES; IONS; LENSES; MICROSCOPY; OPTICAL MICROSCOPES; PARTICLE TRACKS; POLYMERS; SENSORS; TIME RESOLUTION