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Title: X-ray grating interferometry at photon energies over 180 keV

We report on the implementation and characterization of grating interferometry operating at an x-ray energy of 183 keV. With the possibility to use this technique at high x-ray energies, bigger specimens could be studied in a quantitative way. Also, imaging strongly absorbing specimens will benefit from the advantages of the phase and dark-field signals provided by grating interferometry. However, especially at these high photon energies the performance of the absorption grating becomes a key point on the quality of the system, because the grating lines need to keep their small width of a couple of micrometers and exhibit a greater height of hundreds of micrometers. The performance of high aspect ratio absorption gratings fabricated with different techniques is discussed. Further, a dark-field image of an alkaline multicell battery highlights the potential of high energy x-ray grating based imaging.
Authors:
 [1] ;  [2] ; ; ; ;  [3] ;  [4] ;  [5] ;  [1] ;  [6] ;  [4] ;  [2]
  1. European Synchrotron Radiation Facility, 71 Rue des Martyrs, 38000 Grenoble (France)
  2. (Germany)
  3. Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)
  4. Lehrstuhl für Biomedizinische Physik, Physik-Department and Institut für Medizintechnik, Technische Universität München, James-Franck-Str. 1, 85748 Garching (Germany)
  5. (United Kingdom)
  6. Institute of Materials Research, Helmholtz-Zentrum Geesthacht, Max-Plank Strasse 1, 21502 Geesthacht (Germany)
Publication Date:
OSTI Identifier:
22398886
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION; ALKALI METAL COMPOUNDS; ASPECT RATIO; GRATINGS; IMAGES; IMPLEMENTATION; INTERFEROMETRY; KEV RANGE; PERFORMANCE; PHOTONS; SIGNALS; X RADIATION