skip to main content

SciTech ConnectSciTech Connect

Title: Vacuum-ultraviolet photoreduction of graphene oxide: Electrical conductivity of entirely reduced single sheets and reduced micro line patterns

We here report a scanning probe method to locally and directly research the electrical properties of vacuum-ultraviolet (VUV) reduced graphene oxide. The measured electrical conductivity of individual VUV-reduced GO (VUV-rGO) sheets by using conductive atomic force microscopy (CAFM) reached 0.20 S·m{sup −1} after 64 min irradiation, which was clearly enhanced compared with the pristine GO. According to the X-ray photoelectron spectroscopy results, the recovered conductivity of VUV-rGO could be ascribed to the partial elimination of oxygen-containing functional groups and the rapid reconstruction of the C=C bonds. Heterogeneously distributed low- and high-conductivity domains (with a diameter of tens of nanometer to ca. 500 nm) were found from current mapping of the VUV-rGO sheet. By applying photomask lithography, rGO regions were drawn into single GO sheet and were researched by CAFM. The in-plane lateral conductivity of rGO regions increased obviously compared with pristine GO regions.
Authors:
; ; ;  [1]
  1. Department of Materials Science and Engineering, Graduate School of Engineering, Kyoto University, Kyoto 606-8501 (Japan)
Publication Date:
OSTI Identifier:
22398830
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 13; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; CARBON OXIDES; CHEMICAL BONDS; COMPARATIVE EVALUATIONS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; FAR ULTRAVIOLET RADIATION; GRAPHENE; IRRADIATION; MAPPING; OXYGEN; PROBES; RADIATION EFFECTS; SHEETS; X-RAY PHOTOELECTRON SPECTROSCOPY