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Title: Electronic structure evolution of fullerene on CH{sub 3}NH{sub 3}PbI{sub 3}

The thickness dependence of fullerene on CH{sub 3}NH{sub 3}PbI{sub 3} perovskite film surface has been investigated by using ultraviolet photoemission spectroscopy (UPS), X-ray photoemission spectroscopy (XPS), and inverse photoemission spectroscopy (IPES). The lowest unoccupied molecular orbital and highest occupied molecular orbital (HOMO) can be observed directly with IPES and UPS. It is observed that the HOMO level in fullerene shifts to lower binding energy. The XPS results show a strong initial shift of core levels to lower binding energy in the perovskite, which indicates that electrons transfer from the perovskite film to fullerene molecules. Further deposition of fullerene forms C{sub 60} solid, accompanied by the reduction of the electron transfer. The strongest electron transfer happened at 1/4 monolayer of fullerene.
Authors:
; ; ;  [1] ;  [2] ; ; ; ;  [3]
  1. Department of Physics and Astronomy, University of Rochester, Rochester, New York, 14627 (United States)
  2. Hunan Key Laboratory for Super-microstructure and Ultrafast Process, College of Physics and Electronics, Central South University, Changsha 410083 (China)
  3. Department of Mechanical and Materials Engineering, Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588 (United States)
Publication Date:
OSTI Identifier:
22395748
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 11; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; AMMONIUM COMPOUNDS; BINDING ENERGY; DEPOSITION; ELECTRON TRANSFER; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; FILMS; LEAD IODIDES; MOLECULAR ORBITAL METHOD; MOLECULES; PEROVSKITE; PHOTOEMISSION; SOLIDS; SURFACES; ULTRAVIOLET RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY