Electronic structure evolution of fullerene on CH{sub 3}NH{sub 3}PbI{sub 3}
- Department of Physics and Astronomy, University of Rochester, Rochester, New York, 14627 (United States)
- Hunan Key Laboratory for Super-microstructure and Ultrafast Process, College of Physics and Electronics, Central South University, Changsha 410083 (China)
- Department of Mechanical and Materials Engineering, Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588 (United States)
The thickness dependence of fullerene on CH{sub 3}NH{sub 3}PbI{sub 3} perovskite film surface has been investigated by using ultraviolet photoemission spectroscopy (UPS), X-ray photoemission spectroscopy (XPS), and inverse photoemission spectroscopy (IPES). The lowest unoccupied molecular orbital and highest occupied molecular orbital (HOMO) can be observed directly with IPES and UPS. It is observed that the HOMO level in fullerene shifts to lower binding energy. The XPS results show a strong initial shift of core levels to lower binding energy in the perovskite, which indicates that electrons transfer from the perovskite film to fullerene molecules. Further deposition of fullerene forms C{sub 60} solid, accompanied by the reduction of the electron transfer. The strongest electron transfer happened at 1/4 monolayer of fullerene.
- OSTI ID:
- 22395748
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 11; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AMMONIUM COMPOUNDS
BINDING ENERGY
DEPOSITION
ELECTRON TRANSFER
ELECTRONIC STRUCTURE
EMISSION SPECTROSCOPY
FILMS
LEAD IODIDES
MOLECULAR ORBITAL METHOD
MOLECULES
PEROVSKITE
PHOTOEMISSION
SOLIDS
SURFACES
ULTRAVIOLET RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY