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Title: Ptychographic x-ray imaging of surfaces on crystal truncation rod

Ptychography is a high-resolution imaging technique, which does not require lenses for image magnification and which provides phase contrast with high sensitivity. Here, we propose to use x-ray ptychography for the imaging of surface structure in crystalline samples. We show that ptychography can be used to image atomic step structures using coherent diffraction patterns recorded along the crystal truncation rod of a crystal surface. In a proof-of-concept experiment on a Pt (111) sample, we present ptychographic reconstructions showing features consistent with surface steps. Due to the penetration power of x-rays, this method could find interesting applications for the study of surface structures under buried interfaces or in harsh environments.
Authors:
; ; ;  [1] ; ;  [2] ; ;  [3] ;  [4] ;  [5] ;  [6]
  1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  2. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  3. Paul Scherrer Institut, Villigen PSI 5232 (Switzerland)
  4. Faculty of Sciences, Safarik University, Kosice 04154 (Slovakia)
  5. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States)
  6. School of Physics and Astronomy, Rochester Institute of Technology, Rochester, New York 14623 (United States)
Publication Date:
OSTI Identifier:
22395697
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; IMAGES; INTERFACES; PLATINUM; RESOLUTION; RODS; SENSITIVITY; SURFACES; X RADIATION