Electrical conductivity of reconstructed Si(111) surface with sodium-doped C{sub 60} layers

Journal Article · Mon Jan 05 00:00:00 EST 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4905288· OSTI ID:22395637

Saranin, A. A. ^[1]; Ryzhkova, M. V.; Borisenko, E. A. ^[1]; Zotov, A. V. ^[1]

---

1. Institute of Automation and Control Processes, FEB RAS, Vladivostok 690041 (Russian Federation)

Electrical conductance of sodium-doped C{sub 60} ultra-thin layers (1–6 monolayers) grown on the Na-adsorbed Si(111)√3 × √3-Au surface has been studied in situ by four-point probe technique, combined with low-energy electron diffraction observations. Evidence of conductance channel formation through the C{sub 60} ultrathin layer is demonstrated as a result of Na dosing of 3 and 6 monolayers thick C{sub 60} layers. The observed changes in surface conductivity can be attributed to the formation of fulleride-like NaC{sub 60} and Na{sub 2}C{sub 60} compound layers.

• OSTI ID: 22395637
• Journal Information: Applied Physics Letters, Vol. 106, Issue 1; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL STRUCTURE
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRON DIFFRACTION
FULLERENES
GOLD
LAYERS
PROBES
SILICON
SODIUM
SURFACES
THIN FILMS