skip to main content

SciTech ConnectSciTech Connect

Title: Large area strain analysis using scanning transmission electron microscopy across multiple images

Here, we apply revolving scanning transmission electron microscopy to measure lattice strain across a sample using a single reference area. To do so, we remove image distortion introduced by sample drift, which usually restricts strain analysis to a single image. Overcoming this challenge, we show that it is possible to use strain reference areas elsewhere in the sample, thereby enabling reliable strain mapping across large areas. As a prototypical example, we determine the strain present within the microstructure of a Ni-based superalloy directly from atom column positions as well as geometric phase analysis. While maintaining atomic resolution, we quantify strain within nanoscale regions and demonstrate that large, unit-cell level strain fluctuations are present within the intermetallic phase.
Authors:
; ;  [1] ; ;  [2] ; ; ;  [3] ; ;  [4]
  1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695-7907 (United States)
  2. Center for the Study of Matter under Extreme Conditions, Florida International University, Miami, Florida 33199 (United States)
  3. Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011 (United States)
  4. Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611 (United States)
Publication Date:
OSTI Identifier:
22395635
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 106; Journal Issue: 1; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMS; FLUCTUATIONS; IMAGES; MAPPING; MICROSTRUCTURE; NANOSTRUCTURES; PHASE STUDIES; RESOLUTION; SCANNING ELECTRON MICROSCOPY; STRAINS; TRANSMISSION ELECTRON MICROSCOPY