skip to main content

Title: On-the-fly scans for X-ray ptychography

With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray ptychography, a scanning microscopy technique that provides nanometric resolution on extended fields of view, and the settling time of the scanning system is one of the bottlenecks for fast imaging. Here, we demonstrate that ptychographic on-the-fly scans, i.e., collecting diffraction patterns while the sample is scanned with constant velocity, can be modelled as a state mixture of the probing radiation and allow for reliable image recovery. Characteristics of the probe modes are discussed for various scan parameters, and the application to significantly reducing the scanning time is considered.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ; ; ; ;  [1] ;  [5]
  1. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
  2. (Germany)
  3. (France)
  4. (Italy)
  5. Department of Physics and Astronomy, University College London, London (United Kingdom)
Publication Date:
OSTI Identifier:
22395574
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 25; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 77 NANOSCIENCE AND NANOTECHNOLOGY; DIFFRACTION; MICROSCOPY; MIXTURES; NANOSTRUCTURES; NANOTECHNOLOGY; PROBES; RESOLUTION; VELOCITY; X RADIATION