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Title: Influence of in-plane and bridging oxygen vacancies of SnO{sub 2} nanostructures on CH{sub 4} sensing at low operating temperatures

Role of “O” defects in sensing pollutant with nanostructured SnO{sub 2} is not well understood, especially at low temperatures. SnO{sub 2} nanoparticles were grown by soft chemistry route followed by subsequent annealing treatment under specific conditions. Nanowires were grown by chemical vapor deposition technique. A systematic photoluminescence (PL) investigation of “O” defects in SnO{sub 2} nanostructures revealed a strong correlation between shallow donors created by the in-plane and the bridging “O” vacancies and gas sensing at low temperatures. These SnO{sub 2} nanostructures detected methane (CH{sub 4}), a reducing and green house gas at a low temperature of 50 °C. Response of CH{sub 4} was found to be strongly dependent on surface defect in comparison to surface to volume ratio. Control over “O” vacancies during the synthesis of SnO{sub 2} nanomaterials, as supported by X-ray photoelectron spectroscopy and subsequent elucidation for low temperature sensing are demonstrated.
Authors:
; ; ; ;  [1] ;  [2]
  1. Surface and Nanoscience Division, Indira Gandhi Center for Atomic Research, Kalpakkam 603102 (India)
  2. Corrosion Science and Technology Group, Indira Gandhi Center for Atomic Research, Kalpakkam 603102 (India)
Publication Date:
OSTI Identifier:
22395546
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; CHEMICAL VAPOR DEPOSITION; COMPARATIVE EVALUATIONS; CORRELATIONS; METHANE; NANOMATERIALS; NANOPARTICLES; NANOWIRES; OXYGEN; PHOTOLUMINESCENCE; SURFACES; SYNTHESIS; TEMPERATURE DEPENDENCE; TIN OXIDES; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY