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Title: The local crystallization in nanoscale diamond-like carbon films during annealing

The local crystallization during annealing at 600 °C in nanoscale diamond-like carbon coatings films grown by pulsed vacuum-arc deposition method was observed using modern techniques of high-resolution transmission electron microscopy. The crystallites formed by annealing have a face-centred cubic crystal structure and grow in the direction [01{sup ¯}1{sup ¯}] as a normal to the film surface. The number and size of the crystallites depend on the initial values of the intrinsic stresses before annealing, which in turn depend on the conditions of film growth. The sizes of crystallites are 10 nm for films with initial compressive stresses of 3 GPa and 17 nm for films with initial compressive stresses of 12 GPa. Areas of local crystallization arising during annealing have a structure different from the graphite. Additionally, the investigation results of the structure of nanoscale diamond-like carbon coatings films using Raman spectroscopy method are presented, which are consistent with the transmission electron microscopy research results.
Authors:
; ; ;  [1] ;  [2]
  1. Problems of Ion-plasma Technologies Development and Implementation Scientific and Research Laboratory, Belgorod State University, 85 Pobeda Str., Belgorod 308015 (Russian Federation)
  2. Nanostructured Materials and Nanotechnologies Science Education and Innovation Centre, 2A Koroleva Street, Belgorod 308034 (Russian Federation)
Publication Date:
OSTI Identifier:
22395496
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 23; Other Information: (c) 2014 U.S. Government; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; COATINGS; CRYSTALLIZATION; DEPOSITION; DIAMONDS; FCC LATTICES; FILMS; GRAPHITE; NANOSTRUCTURES; PRESSURE RANGE GIGA PA; RAMAN SPECTROSCOPY; RESOLUTION; STRESSES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY