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Title: Thermal stability of photovoltaic a-Si:H determined by neutron reflectometry

Neutron and X-ray reflectometry were used to determine the layer structure and hydrogen content of thin films of amorphous silicon (a-Si:H) deposited onto crystalline silicon (Si) wafers for surface passivation in solar cells. The combination of these two reflectometry techniques is well suited for non-destructive probing of the structure of a-Si:H due to being able to probe buried interfaces and having sub-nanometer resolution. Neutron reflectometry is also unique in its ability to allow determination of density gradients of light elements such as hydrogen (H). The neutron scattering contrast between Si and H is strong, making it possible to determine the H concentration in the deposited a-Si:H. In order to correlate the surface passivation properties supplied by the a-Si:H thin films, as quantified by obtainable effective minority carrier lifetime, photoconductance measurements were also performed. It is shown that the minority carrier lifetime falls sharply when H has been desorbed from a-Si:H by annealing.
Authors:
; ; ; ; ; ;  [1] ; ;  [2] ;  [3] ; ;  [4] ;  [2]
  1. Institute for Energy Technology, P.O. Box 40, NO-2027 Kjeller (Norway)
  2. Division for Materials Physics, Department of Physics and Astronomy, Uppsala University, Box 516, SE-751 20 Uppsala (Sweden)
  3. (France)
  4. Department of Chemistry, Centre for Materials Science and Nanotechnology, University of Oslo, P.O. Box 1033, Blindern, NO-0315 Oslo (Norway)
Publication Date:
OSTI Identifier:
22395465
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 23; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; CARRIER LIFETIME; CONCENTRATION RATIO; HYDROGEN; INTERFACES; NEUTRON DIFFRACTION; PASSIVATION; PHOTOCONDUCTIVITY; PHOTOVOLTAIC EFFECT; PROBES; SILICON; SOLAR CELLS; SURFACES; THIN FILMS; VISIBLE RADIATION; X-RAY DIFFRACTION