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Title: Single Hit Energy-resolved Laue Diffraction

In situ white light Laue diffraction has been successfully used to interrogate the structure of single crystal materials undergoing rapid (nanosecond) dynamic compression up to megabar pressures. However, information on strain state accessible via this technique is limited, reducing its applicability for a range of applications. We present an extension to the existing Laue diffraction platform in which we record the photon energy of a subset of diffraction peaks. This allows for a measurement of the longitudinal and transverse strains in situ during compression. Consequently, we demonstrate measurement of volumetric compression of the unit cell, in addition to the limited aspect ratio information accessible in conventional white light Laue. We present preliminary results for silicon, where only an elastic strain is observed. VISAR measurements show the presence of a two wave structure and measurements show that material downstream of the second wave does not contribute to the observed diffraction peaks, supporting the idea that this material may be highly disordered, or has undergone large scale rotation.
Authors:
; ; ; ; ;  [1] ; ; ;  [2] ; ;  [3]
  1. Clarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford OX1 3PU (United Kingdom)
  2. Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
  3. Atomic Weapons Establishment, Aldermaston, Reading RG7 4PR (United Kingdom)
Publication Date:
OSTI Identifier:
22392504
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ASPECT RATIO; COMPRESSION; DIFFRACTION; MONOCRYSTALS; PEAKS; PHOTONS; SILICON; STRAINS; VISIBLE RADIATION