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Title: Note: Determining the detection efficiency of excited neutral atoms by a microchannel plate detector

We present a method for determining the detection efficiency of neutral atoms relative to keV ions. Excited D* atoms are produced by D{sub 2} fragmentation in a strong laser field. The fragments are detected by a micro-channel plate detector either directly as neutrals or as keV ions following field ionization and acceleration by a static electric field. Moreover, we propose a new mechanism by which neutrals are detected. We show that the ratio of the yield of neutrals and ions can be related to the relative detection efficiency of these species.
Authors:
; ; ; ; ; ; ;  [1]
  1. J.R. Macdonald Laboratory, Physics Department, Kansas State University, Manhattan, Kansas 66506 (United States)
Publication Date:
OSTI Identifier:
22392481
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCELERATION; ATOMS; DETECTION; EFFICIENCY; ELECTRIC FIELDS; FRAGMENTATION; IONIZATION; IONS; KEV RANGE; LASER RADIATION; MICROCHANNEL ELECTRON MULTIPLIERS; YIELDS