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Title: The experimental setup of the Interaction in Crystals for Emission of RADiation collaboration at Mainzer Mikrotron: Design, commissioning, and tests

Silicon/germanium flat/bent crystals are thin devices able to efficiently deflect charged particle GeV-energy beams up to a few hundreds of μrad; moreover, high intensity photons can be efficiently produced in the so-called Multi-Volume Reflection (MVR) and Multiple Volume Reflections in One Crystal (MVROC) conditions. In the last years, the research interest in this field has moved to the dynamic studies of light negative leptons in the low energy range: the possibility to deflect negative particles and to produce high intensity γ sources via the coherent interactions with crystals in the sub-GeV energy range has been proved by the ICE-RAD (Interaction in Crystals for Emission of RADiation) Collaboration at the MAinzer MIkrotron (MAMI, Germany). This paper describes the setup used by the ICE-RAD experiment for the crystals characterization (both in terms of deflection and radiation emission properties): a high precision goniometer is used to align the crystals with the incoming beam, while a silicon based profilometer and an inorganic scintillator reconstruct, respectively, the particle position and the photon spectra after the samples. The crystals manufacturing process and their characterization, the silicon profilometer commissioning at the CERN PS T9 beamline, and the commissioning of the whole setup installed at MAMI are presented.
Authors:
 [1] ; ;  [2] ; ; ; ; ;  [3] ;  [4] ; ;  [1] ;  [4] ; ;  [5] ;  [4] ;  [6]
  1. Università degli Studi dell’Insubria, Via Valleggio 11, 22100 Como (Italy)
  2. Institut für Kernphysik der Universität Mainz, D-55099 Mainz (Germany)
  3. Università degli Studi di Ferrara, Via Saragat 1, 44100 Ferrara (Italy)
  4. (Italy)
  5. Università degli Studi di Padova, Via Marzolo 8, 35131 Padova (Italy)
  6. INFN Sezione di Trieste, Via Valerio 2, 34127 Trieste (Italy)
Publication Date:
OSTI Identifier:
22392474
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; BEAMS; CHARGED PARTICLES; COMMISSIONING; CRYSTALS; DESIGN; EMISSION; GEV RANGE; GONIOMETERS; INTERACTIONS; PHOTONS; REFLECTION; SILICON; SPECTRA