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Title: Laboratory-based x-ray reflectometer for multilayer characterization in the 15–150 keV energy band

A laboratory-based X-ray reflectometer has been developed to measure the performance of hard X-ray multilayer coatings at their operational X-ray energies and incidence angles. The instrument uses a sealed-tube X-ray source with a tungsten anode that can operate up to 160 kV to provide usable radiation in the 15–150 keV energy band. Two sets of adjustable tungsten carbide slit assemblies, spaced 4.1 m apart, are used to produce a low-divergence white beam, typically set to 40 μm × 800 μm in size at the sample. Multilayer coatings under test are held flat using a vacuum chuck and are mounted at the center of a high-resolution goniometer used for precise angular positioning of the sample and detector; additionally, motorized linear stages provide both vertical and horizontal adjustments of the sample position relative to the incident beam. A CdTe energy-sensitive detector, located behind a third adjustable slit, is used in conjunction with pulse-shaping electronics and a multi-channel analyzer to capture both the incident and reflected spectra; the absolute reflectance of the coating under test is computed as the ratio of the two spectra. The instrument’s design, construction, and operation are described in detail, and example results are presented obtained with both periodic,more » narrow-band and depth-graded, wide-band hard X-ray multilayer coatings.« less
Authors:
 [1]
  1. Reflective X-ray Optics LLC, 1361 Amsterdam Ave., Suite 3B, New York, New York 10027 (United States)
Publication Date:
OSTI Identifier:
22392441
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CADMIUM TELLURIDES; COATINGS; DESIGN; GONIOMETERS; HARD X RADIATION; LAYERS; MULTI-CHANNEL ANALYZERS; PERFORMANCE; RESOLUTION; TUNGSTEN CARBIDES; X-RAY SOURCES