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Title: High-pressure generation using double stage micro-paired diamond anvils shaped by focused ion beam

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4914844· OSTI ID:22392419
;  [1];  [2];  [1]; ;  [3]; ; ; ;  [4]
  1. Geodynamics Research Center, Ehime University, Matsuyama 790-8577 (Japan)
  2. Geochemical Research Center, Graduate School of Science, The University of Tokyo, Tokyo 113-0033 (Japan)
  3. Japan Synchrotron Radiation Research Institute, Hyogo 679-5198 (Japan)
  4. HITACHI High-Technologies, Hitachinaka 312-0033 (Japan)

Micron-sized diamond anvils with a 3 μm culet were successfully processed using a focused ion beam (FIB) system and the generation of high pressures was confirmed using the double stage diamond anvil cell technique. The difficulty of aligning two second-stage micro-anvils was solved via the paired micro-anvil method. Micro-manufacturing using a FIB system enables us to control anvil shape, process any materials, including nano-polycrystalline diamond and single crystal diamond, and assemble the sample exactly in a very small space between the second-stage anvils. This method is highly reproducible. High pressures over 300 GPa were achieved, and the pressure distribution around the micro-anvil culet was evaluated by using a well-focused synchrotron micro-X-ray beam.

OSTI ID:
22392419
Journal Information:
Review of Scientific Instruments, Vol. 86, Issue 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English