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Title: Rapid measurement of charged particle beam profiles using a current flux grating

The principle and physics issues of charged particle beam diagnostics using a current flux grating are presented. Unidirectional array of conducting channels with interstitial insulating layers of spacing d is placed in the beam path to capture flux of charge and electronically reproduce an exact beam current profile with density variation. The role of secondary electrons due to the impinging particle beam (both electron and ion) on the probe is addressed and a correction factor is introduced. A 2-dimensional profile of the electron beam is obtained by rotating the probe about the beam axis. Finally, a comparison of measured beam profile with a Gaussian is presented.
Authors:
; ;  [1]
  1. Department of Physics, Indian Institute of Technology, Kanpur 208016, UP (India)
Publication Date:
OSTI Identifier:
22392354
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAM CURRENTS; BEAM PROFILES; CHARGED PARTICLES; CORRECTIONS; ELECTRON BEAMS; ELECTRONS; GRATINGS; LAYERS