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Title: Mapping of ferroelectric domain structure using angle-resolved piezoresponse force microscopy

Angle-resolved piezoresponse force microscopy (AR-PFM) was used in conjunction with electron backscatter diffraction (EBSD) to study ferroelectric domain structure in polycrystalline near-morphotropic lead zirconate titanate (PZT). We introduce the details of AR-PFM including experimental method, the process to generate AR-PFM maps, and the interpretation of AR-PFM map, using domain patterns observed in bulk PZT. The spatial distortion caused by scanner creep and non-linearity in scanning probe microscopy was corrected through image registration, taking advantage of the features present in topography images. Domain structures were mapped using AR-PFM data, and the maps consistently show alternating piezoresponse axes in a lamellar pattern of non-180° domain structure. Comparison of AR-PFM and EBSD data showed a discrepancy between the direction of lateral surface displacement and the in-plane polarization direction. Additionally, using suitable domain patterns, AR-PFM enabled discrimination between the tetragonal and rhombohedral phases at the sub-grain scale.
Authors:
;  [1]
  1. Department of Engineering Science, University of Oxford, Oxford OX1 3PJ (United Kingdom)
Publication Date:
OSTI Identifier:
22392317
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 1; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BACKSCATTERING; CREEP; DOMAIN STRUCTURE; ELECTRON DIFFRACTION; ELECTRONS; FERROELECTRIC MATERIALS; IMAGES; MAPPING; MICROSCOPY; POLARIZATION; POLYCRYSTALS; PZT; TOPOGRAPHY; TRIGONAL LATTICES