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Title: Fast temperature spectrometer for samples under extreme conditions

We have developed a multi-wavelength Fast Temperature Readout (FasTeR) spectrometer to capture a sample’s transient temperature fluctuations, and reduce uncertainties in melting temperature determination. Without sacrificing accuracy, FasTeR features a fast readout rate (about 100 Hz), high sensitivity, large dynamic range, and a well-constrained focus. Complimenting a charge-coupled device spectrometer, FasTeR consists of an array of photomultiplier tubes and optical dichroic filters. The temperatures determined by FasTeR outside of the vicinity of melting are, generally, in good agreement with results from the charge-coupled device spectrometer. Near melting, FasTeR is capable of capturing transient temperature fluctuations, at least on the order of 300 K/s. A software tool, SIMFaster, is described and has been developed to simulate FasTeR and assess design configurations. FasTeR is especially suitable for temperature determinations that utilize ultra-fast techniques under extreme conditions. Working in parallel with the laser-heated diamond-anvil cell, synchrotron Mössbauer spectroscopy, and X-ray diffraction, we have applied the FasTeR spectrometer to measure the melting temperature of {sup 57}Fe{sub 0.9}Ni{sub 0.1} at high pressure.
Authors:
 [1] ;  [2] ; ;  [1] ; ; ; ;  [3]
  1. Seismological Laboratory, California Institute of Technology, Pasadena, California 91125 (United States)
  2. (United States)
  3. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Publication Date:
OSTI Identifier:
22392305
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 86; Journal Issue: 1; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; CAPTURE; CHARGE-COUPLED DEVICES; DIAMONDS; FLUCTUATIONS; IRON 57; LASERS; MELTING; MELTING POINTS; READOUT SYSTEMS; SENSITIVITY; SPECTROMETERS; SPECTROSCOPY; SYNCHROTRONS; WAVELENGTHS; X-RAY DIFFRACTION