skip to main content

Title: Transient x-ray diffraction with simultaneous imaging under high strain-rate loading

Real time, in situ, multiframe, diffraction, and imaging measurements on bulk samples under high and ultrahigh strain-rate loading are highly desirable for micro- and mesoscale sciences. We present an experimental demonstration of multiframe transient x-ray diffraction (TXD) along with simultaneous imaging under high strain-rate loading at the Advanced Photon Source beamline 32ID. The feasibility study utilizes high strain-rate Hopkinson bar loading on a Mg alloy. The exposure time in TXD is 2–3 μs, and the frame interval is 26.7–62.5 μs. Various dynamic deformation mechanisms are revealed by TXD, including lattice expansion or compression, crystal plasticity, grain or lattice rotation, and likely grain refinement, as well as considerable anisotropy in deformation. Dynamic strain fields are mapped via x-ray digital image correlation, and are consistent with the diffraction measurements and loading histories.
Authors:
; ; ;  [1] ; ;  [1] ;  [2] ;  [3] ; ;  [4] ;  [5]
  1. The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 (China)
  2. (China)
  3. School of Science, Wuhan University of Technology, Wuhan, Hubei 430070 (China)
  4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  5. School of Aeronautics and Astronautics, and School of Material Science Engineering, Purdue University, West Lafayette, Indiana 47907 (United States)
Publication Date:
OSTI Identifier:
22392235
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ADVANCED PHOTON SOURCE; ALLOYS; ANISOTROPY; COMPRESSION; CRYSTALS; DEFORMATION; EXPANSION; FEASIBILITY STUDIES; GRAIN REFINEMENT; IMAGES; STRAIN RATE; STRAINS; TRANSIENTS; X RADIATION; X-RAY DIFFRACTION