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Title: Bulk sensitive hard x-ray photoemission electron microscopy

Hard x-ray photoelectron spectroscopy (HAXPES) has now matured into a well-established technique as a bulk sensitive probe of the electronic structure due to the larger escape depth of the highly energetic electrons. In order to enable HAXPES studies with high lateral resolution, we have set up a dedicated energy-filtered hard x-ray photoemission electron microscope (HAXPEEM) working with electron kinetic energies up to 10 keV. It is based on the NanoESCA design and also preserves the performance of the instrument in the low and medium energy range. In this way, spectromicroscopy can be performed from threshold to hard x-ray photoemission. The high potential of the HAXPEEM approach for the investigation of buried layers and structures has been shown already on a layered and structured SrTiO{sub 3} sample. Here, we present results of experiments with test structures to elaborate the imaging and spectroscopic performance of the instrument and show the capabilities of the method to image bulk properties. Additionally, we introduce a method to determine the effective attenuation length of photoelectrons in a direct photoemission experiment.
Authors:
;  [1] ; ; ;  [2] ; ;  [3] ;  [1] ;  [4]
  1. Peter Grünberg Institute (PGI-6) and JARA-FIT, Research Center Jülich, D-52425 Jülich (Germany)
  2. Focus GmbH, Neukirchner Str. 2, D-65510 Hünstetten (Germany)
  3. DESY Photon Science, Deutsches Elektronen-Synchrotron, D-22603 Hamburg (Germany)
  4. (CeNIDE), Universität Duisburg-Essen, D-47048 Duisburg (Germany)
Publication Date:
OSTI Identifier:
22392233
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; DEPTH; DESIGN; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; FILTERS; HARD X RADIATION; IMAGES; KEV RANGE 01-10; KINETIC ENERGY; LENGTH; PERFORMANCE; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; RESOLUTION; STRONTIUM TITANATES