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Title: Ultrathin polycrystalline 6,13-Bis(triisopropylsilylethynyl)-pentacene films

Ultrathin (<6 nm) polycrystalline films of 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS-P) are deposited with a two-step spin-coating process. The influence of spin-coating conditions on morphology of the resulting film was examined by atomic force microscopy. Film thickness and RMS surface roughness were in the range of 4.0–6.1 and 0.6–1.1 nm, respectively, except for small holes. Polycrystalline structure was confirmed by grazing incidence x-ray diffraction measurements. Near-edge x-ray absorption fine structure measurements suggested that the plane through aromatic rings of TIPS-P molecules was perpendicular to the substrate surface.
Authors:
; ; ; ;  [1] ; ; ; ; ;  [2]
  1. Energy Materials and Surface Sciences Unit (EMSS), Okinawa Institute of Science and Technology Graduate University (OIST), 1919-1 Tancha, Onna-son, Okinawa 904-0495 (Japan)
  2. Pohang Accelerator Laboratory, POSTECH, Pohang 790-784 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22392153
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 33; Journal Issue: 2; Other Information: (c) 2014 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 42 ENGINEERING; ABSORPTION; ATOMIC FORCE MICROSCOPY; DEPOSITS; FILMS; FINE STRUCTURE; MOLECULES; MORPHOLOGY; PENTACENE; POLYCRYSTALS; ROUGHNESS; SPIN-ON COATING; SUBSTRATES; SURFACES; THICKNESS; X RADIATION; X-RAY DIFFRACTION