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Title: Enhancing the platinum atomic layer deposition infiltration depth inside anodic alumina nanoporous membrane

Nanoporous platinum membranes can be straightforwardly fabricated by forming a Pt coating inside the nanopores of anodic alumina membranes (AAO) using atomic layer deposition (ALD). However, the high-aspect-ratio of AAO makes Pt ALD very challenging. By tuning the process deposition temperature and precursor exposure time, enhanced infiltration depth along with conformal coating was achieved for Pt ALD inside the AAO templates. Cross-sectional scanning electron microscopy/energy dispersive x-ray spectroscopy and small angle neutron scattering were employed to analyze the Pt coverage and thickness inside the AAO nanopores. Additionally, one application of platinum-coated membrane was demonstrated by creating a high-density protein-functionalized interface.
Authors:
; ; ;  [1] ;  [2] ;  [3] ;  [4]
  1. National Institute of Standards and Technology (NIST) Center for Neutron Research, Gaithersburg, MD 20899-8313 (United States)
  2. Institute for Bioscience and Biotechnology Research, NIST, Rockville, Maryland 20850 (United States)
  3. NIST Center for Nanoscale Science and Technology, Gaithersburg, Maryland 20899-8313 (United States)
  4. Laboratory of Membrane Biochemistry and Biophysics, National Institute on Alcohol Abuse and Alcoholism, National Institutes of Health, Bethesda, Maryland 20892 (United States)
Publication Date:
OSTI Identifier:
22392121
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 33; Journal Issue: 1; Other Information: (c) 2014 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 42 ENGINEERING; ALUMINIUM OXIDES; ASPECT RATIO; DEPOSITION; DEPTH; MEMBRANES; NEUTRON DIFFRACTION; PLATINUM; PRECURSOR; SCANNING ELECTRON MICROSCOPY; SMALL ANGLE SCATTERING; THICKNESS; X-RAY SPECTROSCOPY