skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Contact-dependent performance variability of monolayer MoS{sub 2} field-effect transistors

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4902866· OSTI ID:22392081
;  [1]
  1. Department of Electrical and Computer Engineering and Waterloo Institute for Nanotechnology, University of Waterloo, Waterloo, Ontario N2L 3G1 (Canada)

Using self-consistent quantum transport simulations, we investigate the performance variability of monolayer molybdenum disulfide (MoS{sub 2}) field-effect transistors (FETs) with various contact properties. Varying the Schottky barrier in MoS{sub 2} FETs affects the output characteristics more significantly than the transfer characteristics. If doped contacts are realized, the performance variation due to non-ideal contacts becomes negligible; otherwise, channel doping can effectively suppress the performance variability in metal-contact devices. Our scaling study also reveals that for sub-10-nm channels, doped-contact devices can be more robust in terms of switching, while metal-contact MoS{sub 2} FETs can undergo the smaller penalty in output conductance.

OSTI ID:
22392081
Journal Information:
Applied Physics Letters, Vol. 105, Issue 21; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English