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Title: Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
Authors:
;  [1] ; ; ; ;  [2]
  1. Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan (China)
  2. Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan (China)
Publication Date:
OSTI Identifier:
22391998
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 20; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BINDING ENERGY; CHALCOGENIDES; CHEMICAL VAPOR DEPOSITION; ELECTRONIC STRUCTURE; ELLIPSOMETRY; L-S COUPLING; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; TRANSITION ELEMENTS