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Title: Fabrication of chitosan/polyacrylonitrile blend and semi-IPN hydrogel with epichlorohydrin

The present study is focused on the preparation of chitosan (CS)/polyacrylonitrile (PAN) blend and semi-interpenetrating polymer network (sIPN). Blend CS/PAN hydrogel films (HFs) were prepared by solution blending and casting technique. CS in the blend was crosslinked with epichlorohydrin (ECH) to prepare sIPN. The developed CS/PAN blend and sIPN hydrogels were characterized with Field Emission Scanning Electron Microscopy (FE-SEM), Fourier transform infrared spectroscopy (FTIR), Thermagravimetric analysis (TGA), and Differential Scanning Calorimeter (DSC). The result showed good miscibility between CS and PAN and crosslinking of CS in the blend. The swelling of the different blended and sIPN hydrogels samples were examined at room temperature (T{sub r}). Blend (C80/P20) sample showed highest swelling (∼2400%) and fair degree of stability (∼28% until 96 h), whereas sIPN hydrogel exhibited relatively low degree of swelling (∼244%) and high degree of aqueous (∼85 % until 96 h), and thermal (onset temperature 304°C) stabilities.
Authors:
; ; ;  [1]
  1. Department of Chemical Engineering, College of Engineering, King Saud University, P.O BOX 800, Riyadh 11421, KSA (Saudi Arabia)
Publication Date:
OSTI Identifier:
22391848
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1664; Journal Issue: 1; Conference: PPS-30: 30. International Conference of the Polymer Processing Society, Cleveland, OH (United States), 6-12 Jun 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; AMINO ACIDS; CALORIMETRY; CASTING; CROSS-LINKING; FIELD EMISSION; FILMS; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; HYDROGELS; INFRARED SPECTRA; NITRILES; OLIGOSACCHARIDES; ORGANIC POLYMERS; SCANNING ELECTRON MICROSCOPY; SWELLING; TEMPERATURE RANGE 0273-0400 K; THERMAL GRAVIMETRIC ANALYSIS