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Title: Effect of thermal annealing on structure and optical band gap of Se{sub 66}Te{sub 25}In{sub 9} thin films

Thin films of a-Se{sub 66}Te{sub 25}In{sub 9} have been deposited onto a chemically cleaned glass substrate by thermal evaporation technique under vacuum. Glassy nature of the films has been ascertained by X-ray diffraction pattern. The analysis of absorption spectra, measured at normal incidence, in the spectral range 400-1100 nm has been used for the optical characterization of thin films under investigation. The effect of thermal annealing on structure and optical band gap (E{sub g}) of a-Se{sub 66}Te{sub 25}In{sub 9} have been studied.
Authors:
; ;  [1] ;  [2]
  1. Amorphous Semiconductor Research Lab Department of Physics, M.M.M. University of Technology, Gorakhpur-273010 (India)
  2. Department of Physics, K.I.E.T., Ghaziabad (India)
Publication Date:
OSTI Identifier:
22391746
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1661; Journal Issue: 1; Conference: ICCMP 2014: International Conference on Condensed Matter Physics 2014, Shimla (India), 4-6 Nov 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTRA; ANNEALING; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; ENERGY GAP; EVAPORATION; GLASS; INDIUM TELLURIDES; SELENIDES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION